Cheng Chen
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A new exploration of quality testing technique for the wafer-scale graphene film based on the terahertz vector network analysis technology
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Impact Factor6.7

DOI number:10.1016/j.apsusc.2023.156498

Affiliation of Author(s):西北大学;荷语布鲁塞尔自由大学(VUB);欧洲微电子中心(IMEC)

Journal:Applied Surface Science

Place of Publication:荷兰

Key Words:Quality testing;Homogeneity;Anisotropy;Terahertz vector network analyzer;Graphene film

Note:第一作者,SCI检索,中科院一区,TOP期刊。

Indexed by:Journal paper

Document Code:10.1016/j.apsusc.2023.156498

Discipline:Engineering

First-Level Discipline:Electronic Science and Techonology

Document Type:J

Volume:616

Page Number:156498-156511

Number of Words:15666

Translation or Not:no

Date of Publication:2023-01-20

Included Journals:SCI

Links to published journals:https://doi.org/10.1016/j.apsusc.2023.156498

First Author:Cheng Chen

Correspondence Author:Zhiyong Zhang

Correspondence Author:Johan Stiens

All the Authors:Ali Pourkazemi

All the Authors:Wu Zhao

All the Authors:Niko Van den Brande

All the Authors:Tom Hauffman

Personal information

Associate professor
Supervisor of Master's Candidates

Name (English):Cheng Chen

Name (Pinyin):chen cheng

Date of Birth:1990-03-19

E-Mail:

Date of Employment:2021-05-17

School/Department:Northwest University-China (NWU)

Administrative Position:Head of the department

Education Level:With Certificate of Graduation for Doctorate Study

Business Address:Room 205, Informatics Building, Chang'an Campus, Northwest University-China

Gender:Male

Contact Information:QQ: 512569826 Email: Cheng.Chen@vub.be; cchen@nwu.edu.cn

Degree:Double Degree

Status:Employed

Academic Titles:Faculty of the Electronics Science and Technology

Other Post:Guest Post-doc Researcher in VUB

Alma Mater:Vrije Universiteit Brussel (VUB); NWU

Discipline:Electrical Circuit and System
Microelectronics and Solid-state Electronics

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