西北大学主页平台管理系统 Cheng Chen--Home-- A new exploration of quality testing technique for the wafer-scale graphene film based on the terahertz vector network analysis technology

Cheng Chen

Associate professor

Supervisor of Master's Candidates

E-Mail:

Date of Employment:2021-05-17

School/Department:Northwest University-China (NWU)

Administrative Position:Vice-dean of the School

Education Level:With Certificate of Graduation for Doctorate Study

Business Address:Room 8215, No.8 Building, Chang'an Campus, Northwest University-China

Gender:Male

Contact Information:QQ: 512569826 Email: Cheng.Chen@vub.be; cchen@nwu.edu.cn

Degree:Double Degree

Status:Employed

Academic Titles:School of Electronics and Information

Other Post:Guest Post-doc Researcher in VUB

Alma Mater:Vrije Universiteit Brussel (VUB); NWU

Discipline:Electrical Circuit and System
Microelectronics and Solid-state Electronics

Recommended MA Supervisor Team member

Paper Publications

Current position: Home > Paper Publications

A new exploration of quality testing technique for the wafer-scale graphene film based on the terahertz vector network analysis technology

Release time:2023-08-14 Hits:

Impact Factor6.7

DOI number:10.1016/j.apsusc.2023.156498

Affiliation of Author(s):西北大学；荷语布鲁塞尔自由大学（VUB）；欧洲微电子中心（IMEC）

Journal:Applied Surface Science

Place of Publication:荷兰

Key Words:Quality testing；Homogeneity；Anisotropy；Terahertz vector network analyzer；Graphene film

Note:第一作者，SCI检索，中科院一区，TOP期刊。

Indexed by:Journal paper

Document Code:10.1016/j.apsusc.2023.156498

Discipline:Engineering

First-Level Discipline:Electronic Science and Techonology

Document Type:J

Volume:616

Page Number:156498-156511

Number of Words:15666

Translation or Not:no

Date of Publication:2023-01-20

Included Journals:SCI

Links to published journals:https://doi.org/10.1016/j.apsusc.2023.156498

First Author:Cheng Chen

Correspondence Author:Zhiyong Zhang

Correspondence Author:Johan Stiens

All the Authors:Ali Pourkazemi

All the Authors:Wu Zhao

All the Authors:Niko Van den Brande

All the Authors:Tom Hauffman

Pre One:Improvement of absorbing stability of carbon nanofibers in sub-terahertz domain using the surface modification of zinc oxide

Next One:Study on photoelectricity properties of SiCN thin films prepared by magnetron sputtering